IIT-ISM Dhanbad Attendance is made and published by
Deys Farm.
AppBrain is an independent app data site and isn't affiliated with Deys Farm.
The app name, icon, screenshots and description belong to Deys Farm and are shown as
published on the App Store.
About IIT-ISM Dhanbad Attendance
IIT-ISM Dhanbad Attendance was an education app developed by Deys Farm. It was removed from the App Store Aug 6, 2025.
User Ratings
The app had no ratings.
App Information
IIT-ISM Dhanbad Attendance was free. The app size was 52.73 MB. The last available version was 2.0.17. The last update was on February 28, 2025.
Technical Requirements
The app had a content rating of High Maturity. The app had been available on the App Store since August 2024.
Description by Deys Farm(from the App Store)
IIT (ISM) Dhanbad Attendance System
Streamline Attendance with OTP and Geolocation
The IIT (ISM) Dhanbad Attendance System is a mobile app designed to simplify students attendance tracking. Available for iOS, it uses OTP and geolocation features to ensure accurate attendance.
Key Features:
User Interfaces: Dedicated interfaces for Professors, Teaching Assistants (TAs), and Students. Course and Student Management: Integrate with MIS to fetch and manage course and student data. Secure Attendance: Mark attendance using OTP and location verification. Customizable Settings: Professors can set OTP duration and location radius. Continuous Class Support: Manage attendance for continuous or multiple classes in a day. Security Measures: Detect fake GPS locations. How It Works:
Professors generate an OTP and location during class. Students mark attendance by entering the OTP and being within the defined location radius. Data integrates seamlessly with existing MIS for accurate record-keeping. Experience hassle-free attendance management with the IIT (ISM) Dhanbad Attendance System. Download now!
Each subscription will automatically renew 3 days before the expiration date for
the same time period. Subscriptions can be cancelled at any time before the renewal.
